This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2014, 5, 1031–1041, doi:10.3762/bjnano.5.116
Figure 1: Scanning electron microscopy (SEM) micrographs of wax surfaces formed by alkanes of varying chain l...
Figure 2: Atomic force microscopy (AFM) height images used for estimating the surface roughness parameters Ra...
Figure 3: Traction forces of male beetles Coccinella septempunctata (a) and pull-off forces of PDMS semi-sphe...
Figure 4: Traction forces of male beetles Coccinella septempunctata vs crystal densities (a) and pull-off for...
Figure 5: SEM micrographs of tarsal attachment devices in the male beetle Coccinella septempunctata: tarsus o...